Publication
Title
Fundamental aspects of inorganic SIMS
Author
Language
English
Source (book)
ToF-SIMS: surface analysis by mass sepctrometry / Vickermann, J. [edit.]
Publication
Chichester : Surface Spectra & IM, 2001
Volume/pages
p. 195-222
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.07.2013
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