Publication
Title
Fundamental aspects of inorganic SIMS
Author
Adriaens, A.
van Ham, R.
Van Vaeck, L.
Language
English
Source (book)
ToF-SIMS: surface analysis by mass sepctrometry / Vickermann, J. [edit.]
Publication
Chichester
:
Surface Spectra & IM
,
2001
Volume/pages
p. 195-222
UAntwerpen
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Publication type
H3 Book chapter
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation
08.10.2008
Last edited
07.10.2022
To cite this reference
https://hdl.handle.net/10067/375190151162165141