Publication
Title
Effect of the relaxation of the electron subsystem excitation in metals on the ionization probability of sputtered ions
Author
Abstract
A model describing the effect of the relaxation of the electron subsystem excitation in metals on the ionization process of sputtered atoms is proposed. It explains the strong difference in experimental velocity dependence of the ionization probability P+ of sputtered atoms measured for the same Ar+-Cu system. (C) 2003 Elsevier Science B.V. All rights reserved.
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
Publication
Amsterdam : 2003
ISSN
0168-583X
Volume/pages
203(2003), p. 172-177
ISI
000182624600028
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 09.09.2017
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