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Title
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Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
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Author
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Language
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English
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Source (book)
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Proceedings of the combined 1st PICXAM and 40th Annual Conference on Applications of X-Ray Analysis, August 7-16, 1991, Hawaii / Barrett, C.S. [edit.]
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Publication
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New York
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Plenum Press
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1992
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Volume/pages
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p. 1265-1273
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