Title
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
conferenceObject
Publication
New York :Plenum Press, [*]
Source (book)
Proceedings of the combined 1st PICXAM and 40th Annual Conference on Applications of X-Ray Analysis, August 7-16, 1991, Hawaii / Barrett, C.S. [edit.]
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle