Publication
Title
Comparison of synchrotron X-ray microanalysis with electron and proton microscopy for individual particle analysis
Author
Language
English
Source (book)
Proceedings of the combined 1st PICXAM and 40th Annual Conference on Applications of X-Ray Analysis, August 7-16, 1991, Hawaii / Barrett, C.S. [edit.]
Publication
New York : Plenum Press, 1992
Volume/pages
p. 1265-1273
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 12.09.2013
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