Title
Depth profiling of coated steel wires by GDMS Depth profiling of coated steel wires by GDMS
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
conferenceObject
Publication
Chichester :Wiley, [*]
Source (book)
Secondary Ion Mass Spectrometry (SIMS VIII), September 15-20th, 1991, The Netherlands: proceedings of the 8th International Conference on SIMS / Benninghoven, A. [edit.]
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle