Title
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An expert system for chemical speciation of individual particles using low-Z particle electron probe X-ray microanalysis data
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Author
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Language
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English
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Source (journal)
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Analytical chemistry. - Washington, D.C., 1948, currens
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Publication
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Washington, D.C.
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2004
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ISSN
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0003-2700
[print]
5206-882X
[online]
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DOI
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10.1021/AC035149I
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Volume/pages
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76
(2004)
, p. 1322-1327
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ISI
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000189275100020
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Full text (Publisher's DOI)
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