Publication
Title
Electron microscopy study of defects in synthetic diamond layers
Author
Language
English
Source (journal)
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties. - London, 1978 - 2002
Publication
London : 1992
ISSN
0141-8610
1364-2804
Volume/pages
66:6(1992), p. 899-915
ISI
A1992KC54700003
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 14.09.2017
To cite this reference