Title
A model-based correction method for beam hardening artefacts in X-ray microtomography A model-based correction method for beam hardening artefacts in X-ray microtomography
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
San Diego, Calif. ,
Source (journal)
Journal of X-ray science and technology. - San Diego, Calif.
Volume/pages
12(2004) :1 , p. 53-57
ISSN
0895-3996
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle