Publication
Title
How to optimize the experimental design of quantitative atomic resolution TEM experiments?
Author
Van Aert, S.
den Dekker, A.J.
Van Dyck, D.
Language
English
Source (journal)
Micron
Publication
2004
Volume/pages
35(2004), p. 425-429
ISI
000221721000005
Full text (Publisher's DOI)
https://doi.org/10.1016/J.MICRON.2004.01.007
UAntwerpen
Faculty/Department
Faculty of Sciences. Physics
Research group
Electron microscopy for materials research (EMAT)
Vision lab
Publication type
A1 Journal article
Affiliation
Publications with a UAntwerp address
External links
Web of Science
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Record
Identification
Creation
08.10.2008
Last edited
29.03.2021
To cite this reference
https://hdl.handle.net/10067/475140151162165141