Title
High-resolution electron microscopy : from imaging toward measuring High-resolution electron microscopy : from imaging toward measuring
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York, N.Y. ,
Source (journal)
IEEE transactions on instrumentation and measurement. - New York, N.Y.
Volume/pages
51(2002) :4 , p. 611-615
ISSN
0018-9456
ISI
000178992000010
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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