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Title
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High-resolution electron microscopy : from imaging toward measuring
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Author
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Language
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English
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Source (journal)
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IEEE transactions on instrumentation and measurement. - New York, N.Y.
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Publication
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New York, N.Y.
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2002
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ISSN
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0018-9456
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DOI
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10.1109/TIM.2002.802250
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Volume/pages
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51
:4
(2002)
, p. 611-615
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ISI
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000178992000010
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Full text (Publisher's DOI)
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