Publication
Title
High-resolution electron microscopy : from imaging toward measuring
Author
Language
English
Source (journal)
IEEE transactions on instrumentation and measurement. - New York, N.Y.
Publication
New York, N.Y. : 2002
ISSN
0018-9456
Volume/pages
51:4(2002), p. 611-615
ISI
000178992000010
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 28.07.2017
To cite this reference