| Title |
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High-resolution electron microscopy : from imaging toward measuring
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| Author |
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| Language |
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English
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| Source (journal) |
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IEEE transactions on instrumentation and measurement. - New York, N.Y. | |
| Publication |
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New York, N.Y. : 2002
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| ISSN |
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0018-9456
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| Volume/pages |
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51:4(2002), p. 611-615
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| ISI |
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000178992000010
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| Full text (Publisher's DOI) |
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