| Title |
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Structure refinement of Cu-Zn-Al austenite, using dynamical electron diffraction data
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| Author |
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| Language |
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English
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| Source (journal) |
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Solid state communications. - New York, N.Y. | |
| Publication |
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New York, N.Y. : 2000
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| ISSN |
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0038-1098
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| Volume/pages |
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116(2000), p. 273-277
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| ISI |
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000089747900008
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| Full text (Publisher's DOI) |
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