| Title |
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Measuring the absolute position of EELS ionisation edges in a TEM
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| Author |
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| Language |
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English
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| Source (journal) |
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Ultramicroscopy. - Amsterdam | |
| Publication |
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Amsterdam : 2004
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| ISSN |
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0304-3991
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| Volume/pages |
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99(2004), p. 73-85
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| ISI |
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000220804700005
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| Full text (Publisher's DOI) |
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