Title |
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Measuring the absolute position of EELS ionisation edges in a TEM
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Author |
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Language |
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English
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Source (journal) |
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Ultramicroscopy. - Amsterdam | |
Publication |
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Amsterdam : 2004
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ISSN |
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0304-3991
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Volume/pages |
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99(2004), p. 73-85
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ISI |
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000220804700005
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Full text (Publisher's DOI) |
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