Title
The effect of beam hardening on resolution in X-ray microtomographyThe effect of beam hardening on resolution in X-ray microtomography
Author
Faculty/Department
Faculty of Sciences. Physics
Research group
Vision lab
Department of Physics
Publication type
conferenceObject
Publication
s.l. , [*]
Source (book)
SPIE Medical Imaging, San Diego, Calif., USA, February 14-19, 2004
ISI
000222378600227
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle