The effect of beam hardening on resolution in X-ray microtomography

Publication

Title

Author

Language

English

Source (book)

SPIE Medical Imaging, San Diego, Calif., USA, February 14-19, 2004

Publication

s.l. : 2004

DOI

10.1117/12.535263

Volume/pages

p. 2089-2096

ISI

000222378600227

Full text (Publisher's DOI)

UAntwerpen

Faculty/Department				Faculty of Sciences. Physics

Research group				Vision lab
Publication type				P1 Proceeding

Affiliation				Publications with a UAntwerp address

External links

Web of Science

Record

Identifier

Creation

08.10.2008

Last edited

04.03.2024

To cite this reference