Publication
Title
The effect of beam hardening on resolution in X-ray microtomography
Author
Language
English
Source (book)
SPIE Medical Imaging, San Diego, Calif., USA, February 14-19, 2004
Publication
s.l. : 2004
Volume/pages
p. 2089-2096
ISI
000222378600227
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 27.07.2017
To cite this reference