Publication
Title
Why evaluate ontology technologies? Because it works!
Author
Language
English
Source (journal)
IEEE intelligent systems / Institute of Electrical and Electronics Engineers [New York, N.Y.] - New York, N.Y.
Publication
New York, N.Y. : 2004
ISSN
1541-1672
Volume/pages
19:4(2004), p. 74-81
ISI
000222890900012
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 28.04.2017
To cite this reference