Publication
Title
Imaging TOF-SIMS for the surface analysis of silver halide microcrystals
Author
Language
English
Source (journal)
Applied surface science. - Amsterdam
Publication
Amsterdam : 2003
ISSN
0169-4332
Volume/pages
203/204(2003), p. 614-619
ISI
000180527300138
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 11.12.2017
To cite this reference