Title
Imaging TOF-SIMS for the surface analysis of silver halide microcrystalsImaging TOF-SIMS for the surface analysis of silver halide microcrystals
Author
Faculty/Department
Faculty of Sciences. Chemistry
Research group
Plasma, laser ablation and surface modeling - Antwerp (PLASMANT)
Mass Spectrometry (Mitac 5)
Publication type
article
Publication
Amsterdam,
Source (journal)
Applied surface science. - Amsterdam
Volume/pages
203/204(2003), p. 614-619
ISSN
0169-4332
ISI
000180527300138
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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