Publication
Title
Ion-bombardment artifact in TOF-SIMS analysis of stacks
Author
Abstract
Language
English
Source (journal)
Applied surface science. - Amsterdam
Publication
Amsterdam : Elsevier science bv, 2003
ISSN
0169-4332
Volume/pages
203(2003), p. 523-526
ISI
000180527300119
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 15.09.2018
To cite this reference