Publication
Title
Depth profiling of stacks : a TOF-SIMS and computer simulation study
Author
Abstract
Language
English
Source (journal)
Applied surface science. - Amsterdam
Publication
Amsterdam : 2004
ISSN
0169-4332
Volume/pages
231/232(2004), p. 603-608
ISI
000222427700118
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 05.08.2018
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