Publication
Title
Accurate measurements of atomic displacements in thin films grown on a substrate
Author
Geuens, P.
Lebedev, O.I.
Van Dyck, D.
Van Tendeloo, G.
Language
English
Source (book)
EUREM 12, Brno, Czech Republic, 2000
Publication
s.l.
:
2000
Volume/pages
p. 1133-1134
UAntwerpen
Faculty/Department
Faculty of Sciences. Physics
Publication type
H3 Book chapter
Affiliation
Publications with a UAntwerp address
External links
Record
Identifier
Creation
08.10.2008
Last edited
04.03.2024
To cite this reference
https://hdl.handle.net/10067/547300151162165141