Publication
Title
Accurate measurements of atomic displacements in thin films grown on a substrate
Author
Language
English
Source (book)
EUREM 12, Brno, Czech Republic, 2000
Publication
s.l. : 2000
Volume/pages
p. 1133-1134
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 23.12.2015
To cite this reference