Publication
Title
Reconstruction of the interface by quantitative high-resolution electron microscopy
Author
Language
English
Source (journal)
Solid state communications. - New York, N.Y.
Publication
New York, N.Y. : 2000
ISSN
0038-1098
Volume/pages
116:12(2000), p. 643-648
ISI
000165546500001
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 18.11.2017
To cite this reference