Title
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Reconstruction of the interface by quantitative high-resolution electron microscopy
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Author
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Language
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English
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Source (journal)
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Solid state communications. - New York, N.Y.
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Publication
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New York, N.Y.
:
2000
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ISSN
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0038-1098
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DOI
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10.1016/S0038-1098(00)00411-7
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Volume/pages
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116
:12
(2000)
, p. 643-648
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ISI
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000165546500001
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Full text (Publisher's DOI)
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