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Title
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High-resolution electron microscopy study of strained epitaxial thin films
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Author
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Language
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English
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Source (journal)
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Philosophical magazine: A: physics of condensed matter: defects and mechanical properties. - London, 1978 - 2002
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Publication
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London
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2000
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ISSN
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0141-8610
1364-2804
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DOI
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10.1080/01418610008212075
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Volume/pages
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80
:3
(2000)
, p. 673-691
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ISI
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000085873500011
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Full text (Publisher's DOI)
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