Publication
Title
High-resolution electron microscopy study of strained epitaxial thin films
Author
Language
English
Source (journal)
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties. - London, 1978 - 2002
Publication
London : 2000
ISSN
0141-8610
1364-2804
Volume/pages
80:3(2000), p. 673-691
ISI
000085873500011
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 11.09.2017
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