Publication
Title
Transmission electron microscopy of thin films on silicon substrates
Author
Language
English
Source (journal)
European physical journal: applied physics. - Paris
Publication
Paris : 2000
ISSN
1286-0042
Volume/pages
12(2000), p. 55-60
ISI
000165528800006
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 18.08.2017
To cite this reference