Tomography using annular dark field imaging in TEM

Publication

Title				Tomography using annular dark field imaging in TEM

Author				Bals, S. Kisielowski, C. Croitoru, M. Van Tendeloo, G.

Language				English

Source (journal)				Microscopy and microanalysis

Publication				2005

Volume/pages				11 :S (2005) , p. 2118-2119

UAntwerpen

Faculty/Department				Faculty of Sciences. Physics

Research group				Electron microscopy for materials research (EMAT)
Publication type				A3 Journal article

Affiliation				Publications with a UAntwerp address

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08.10.2008

Last edited

04.03.2024

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