Title
Focal shift correction on thickness data measured with confocal microscopy Focal shift correction on thickness data measured with confocal microscopy
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
conferenceObject
Publication
s.l. , [*]
Source (book)
Proceedings of the 13th European Microscopy Congress, 2004
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle