Publication
Title
Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates
Author
Language
English
Source (journal)
Talanta
Publication
2006
Volume/pages
69:1(2006), p. 91-96
ISI
000235510000014
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 19.07.2017
To cite this reference