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Title
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Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates
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Author
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Language
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English
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Source (journal)
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Talanta
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Publication
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2006
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DOI
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10.1016/J.TALANTA.2005.09.012
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Volume/pages
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69
:1
(2006)
, p. 91-96
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ISI
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000235510000014
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Full text (Publisher's DOI)
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