Title
The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Amsterdam ,
Source (journal)
Analytica chimica acta. - Amsterdam
Volume/pages
558(2006) , p. 115-124
ISSN
0003-2670
ISI
000235116600019
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle