Title
|
|
|
|
The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces
| |
Author
|
|
|
|
| |
Language
|
|
|
|
English
| |
Source (journal)
|
|
|
|
Analytica chimica acta. - Amsterdam, 1947, currens
| |
Publication
|
|
|
|
Amsterdam
:
2006
| |
ISSN
|
|
|
|
0003-2670
[print]
1873-4324
[online]
| |
DOI
|
|
|
|
10.1016/J.ACA.2005.11.041
| |
Volume/pages
|
|
|
|
558
(2006)
, p. 115-124
| |
ISI
|
|
|
|
000235116600019
| |
Full text (Publisher's DOI)
|
|
|
|
| |
|