Title
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Model based quantification of EELS spectra
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Author
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Language
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English
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Source (journal)
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Ultramicroscopy. - Amsterdam
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Publication
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Amsterdam
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2004
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ISSN
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0304-3991
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DOI
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10.1016/J.ULTRAMIC.2004.06.004
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Volume/pages
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101
:2/4
(2004)
, p. 207-224
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ISI
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000224046100016
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Full text (Publisher's DOI)
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