Publication
Title
Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: part 1: a theoretical framework
Author
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2005
ISSN
0304-3991
Volume/pages
104:2(2005), p. 83-106
ISI
000230526400001
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 10.09.2017
To cite this reference