Title
|
|
|
|
A method to calculate tunneling leakage currents in silicon inversion layers
| |
Author
|
|
|
|
| |
Language
|
|
|
|
English
| |
Source (journal)
|
|
|
|
Journal of applied physics / American Institute of Physics. - New York, N.Y., 1937, currens
| |
Publication
|
|
|
|
New York, N.Y.
:
American Institute of Physics
,
2006
| |
ISSN
|
|
|
|
0021-8979
[print]
1089-7550
[online]
| |
DOI
|
|
|
|
10.1063/1.2219343
| |
Volume/pages
|
|
|
|
100
:3
(2006)
, p. 033708,1-5
| |
ISI
|
|
|
|
000239764100051
| |
Full text (Publisher's DOI)
|
|
|
|
| |
|