Title
A method to calculate tunneling leakage currents in silicon inversion layers A method to calculate tunneling leakage currents in silicon inversion layers
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
New York, N.Y. :American Institute of Physics ,
Source (journal)
Journal of applied physics / American Institute of Physics. - New York, N.Y., 1937, currens
Volume/pages
100(2006) :3 , p. 033708,1-5
ISSN
0021-8979
1089-7550
ISI
000239764100051
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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