Publication
Title
A method to calculate tunneling leakage currents in silicon inversion layers
Author
Language
English
Source (journal)
Journal of applied physics / American Institute of Physics. - New York, N.Y., 1937, currens
Publication
New York, N.Y. : American Institute of Physics, 2006
ISSN
0021-8979 [print]
1089-7550 [online]
Volume/pages
100:3(2006), p. 033708,1-5
ISI
000239764100051
Full text (Publishers DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 14.05.2017
To cite this reference