| Title |
|
|
|
Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
| |
| Author |
|
|
|
| |
| Language |
|
|
|
English
| |
| Source (journal) |
|
|
|
Applied surface science. - Amsterdam | |
| Publication |
|
|
|
Amsterdam : 2006
| |
| ISSN |
|
|
|
0169-4332
| |
| Volume/pages |
|
|
|
252:19(2006), p. 6660-6663
| |
| ISI |
|
|
|
000240609900065
| |
| Full text (Publisher's DOI) |
|
|
| | |
|