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Title
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Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
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Author
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Language
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English
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Source (journal)
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Applied surface science. - Amsterdam
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Publication
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Amsterdam
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2006
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ISSN
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0169-4332
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DOI
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10.1016/J.APSUSC.2006.02.240
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Volume/pages
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252
:19
(2006)
, p. 6660-6663
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ISI
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000240609900065
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Full text (Publisher's DOI)
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