Publication
Title
Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films
Author
Language
English
Source (journal)
Applied surface science. - Amsterdam
Publication
Amsterdam : 2006
ISSN
0169-4332
Volume/pages
252:19(2006), p. 6660-6663
ISI
000240609900065
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 10.07.2017
To cite this reference