Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison

Publication

Title				Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison

Author				Alfeld, M. Vekemans, B. Janssens, K. Falkenberg, G. Broekaert, J.A.C. Gao, N. Gibson, D.

Language				English

Source (book)				HASYLAB Jahresbericht 2006 / Schneider, J. [edit.]

Publication				Hamburg : 2007

UAntwerpen

Faculty/Department				Faculty of Sciences. Chemistry

Research group				AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)

Publication type				H3 Book chapter

Affiliation				Publications with a UAntwerp address

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08.10.2008

Last edited

04.03.2024

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