Title
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
bookPart
Publication
Hamburg , [*]
Source (book)
HASYLAB Jahresbericht 2006 / Schneider, J. [edit.]
Carrier
E
Target language
English (eng)
Affiliation
University of Antwerp
Handle