Publication
Title
Depth profiling of multilayered systems by means of confocal μ-XRF in the laboratory an at HASYLAB BL L: a comparison
Author
Language
English
Source (book)
HASYLAB Jahresbericht 2006 / Schneider, J. [edit.]
Publication
Hamburg : 2007
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Record
Identification
Creation 08.10.2008
Last edited 10.07.2013
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