Publication
Title
Nonlinear imaging using annular dark field TEM
Author
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2005
ISSN
0304-3991
Volume/pages
104:3/4(2005), p. 281-289
ISI
000231297100012
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 04.08.2017
To cite this reference