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Title
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Nonlinear imaging using annular dark field TEM
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Author
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Language
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English
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Source (journal)
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Ultramicroscopy. - Amsterdam
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Publication
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Amsterdam
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2005
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ISSN
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0304-3991
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DOI
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10.1016/J.ULTRAMIC.2005.05.004
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Volume/pages
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104
:3/4
(2005)
, p. 281-289
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ISI
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000231297100012
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Full text (Publisher's DOI)
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