Title
New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
New York, N.Y. ,
Source (journal)
The review of scientific instruments. - New York, N.Y.
Volume/pages
78(2007) , p. 085101,1-9
ISSN
0034-6748
ISI
000249156700044
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle