Publication
Title
New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
Author
Language
English
Source (journal)
The review of scientific instruments. - New York, N.Y.
Publication
New York, N.Y. : 2007
ISSN
0034-6748
Volume/pages
78(2007), p. 085101,1-9
ISI
000249156700044
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 04.06.2017
To cite this reference