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Title
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements
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Author
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Language
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English
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Source (journal)
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Microscopy and microanalysis. - Cambridge, Mass.
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Publication
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Cambridge, Mass.
:
2007
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ISSN
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1431-9276
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DOI
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10.1017/S1431927607070018
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Volume/pages
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13
:2
(2007)
, p. 80-86
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ISI
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000245662200002
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Full text (Publisher's DOI)
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