Publication
Title
High-quality sample preparation by low kV FIB thinning for analytical TEM measurements
Author
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2007
ISSN
1431-9276
Volume/pages
13:2(2007), p. 80-86
ISI
000245662200002
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 04.10.2017
To cite this reference