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Title
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Evaluation of top, angle, and side cleaned FIB samples for TEM analysis
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Author
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Language
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English
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Source (journal)
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Microscopy research and technique. - New York, N.Y.
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Publication
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New York, N.Y.
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2007
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ISSN
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1059-910X
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DOI
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10.1002/JEMT.20514
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Volume/pages
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70
:12
(2007)
, p. 1060-1071
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ISI
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000251868200008
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Full text (Publisher's DOI)
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