Publication
Title
Evaluation of top, angle, and side cleaned FIB samples for TEM analysis
Author
Language
English
Source (journal)
Microscopy research and technique. - New York, N.Y.
Publication
New York, N.Y. : 2007
ISSN
1059-910X
Volume/pages
70:12(2007), p. 1060-1071
ISI
000251868200008
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 16.08.2017
To cite this reference