|
Title
|
|
|
|
Model-based quantification of EELS spectra: treating the effect of correlated noise
| |
|
Author
|
|
|
|
| |
|
Language
|
|
|
|
English
| |
|
Source (journal)
|
|
|
|
Ultramicroscopy. - Amsterdam
| |
|
Publication
|
|
|
|
Amsterdam
:
2008
| |
|
ISSN
|
|
|
|
0304-3991
| |
|
DOI
|
|
|
|
10.1016/J.ULTRAMIC.2007.03.004
| |
|
Volume/pages
|
|
|
|
108
:2
(2008)
, p. 74-83
| |
|
ISI
|
|
|
|
000252816900002
| |
|
Full text (Publisher's DOI)
|
|
|
|
| |
|