Publication
Title
Susceptibility correction for improved tractography using high field DT-EPI
Author
Abstract
Language
English
Source (journal)
Proceedings of the Society of Photo-optical Instrumentation Engineers / SPIE: International Society for Optical Engineering. - Bellingham, Wash.
Source (book)
Proceedings of SPIE Medical Imaging, San Diego, Calif., USA
Publication
San Diego, Calif. : SPIE, 2008
ISBN
978-0-8194-7098-0
Volume/pages
9 p.
Article Reference
I9142
ISI
000256058600087
Medium
E-only publicatie
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 23.03.2018
To cite this reference