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Title
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Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
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Author
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Language
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English
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Source (journal)
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Surface and interface analysis. - London
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Publication
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London
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2008
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ISSN
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0142-2421
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DOI
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10.1002/SIA.2810
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Volume/pages
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40
:3-4
(2008)
, p. 538-542
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ISI
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000255486200091
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Full text (Publisher's DOI)
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