| Title |
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Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
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| Author |
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| Language |
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English
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| Source (journal) |
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Surface and interface analysis. - London | |
| Publication |
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London : 2008
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| ISSN |
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0142-2421
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| Volume/pages |
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40:3-4(2008), p. 538-542
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| ISI |
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000255486200091
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| Full text (Publisher's DOI) |
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