Publication
Title
Investigation of methods to enhance the secondary ion yields in TOF-SIMS of organic samples
Author
Language
English
Source (journal)
Surface and interface analysis. - London
Publication
London : 2008
ISSN
0142-2421
Volume/pages
40:3-4(2008), p. 538-542
ISI
000255486200091
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 13.12.2017
To cite this reference