Publication
Title
Accuracy and precision in model based EELS quantification
Author
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2008
ISSN
0304-3991
Volume/pages
108:8(2008), p. 782-790
ISI
000258241900010
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 08.10.2008
Last edited 31.07.2017
To cite this reference