Publication
Title
Confocal μ-XRF depth analysis of paint layers
Author
Abstract
Language
English
Source (journal)
Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms. - Amsterdam
Publication
Amsterdam : 2004
ISSN
0168-583X
Volume/pages
219(2004), p. 35-40
ISI
000221895800009
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 04.12.2008
Last edited 07.08.2018
To cite this reference