Title
Implementation of a spectrum fitting procedure using a robust peak model Implementation of a spectrum fitting procedure using a robust peak model
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
London ,
Subject
Chemistry
Source (journal)
X-ray spectrometry. - London
Volume/pages
32(2003) :6 , p. 434-441
ISSN
0049-8246
ISI
000186458300005
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
The need for an accurate description of characteristic x-ray lines has led to the development of complex peak models that combine a Gauss, a shelf and a tail function. Via relationships that describe the shelf and tail parameters as a function of the energy, it is possible to reduce the number of fit parameters significantly. In this work, we carried out an experiment to study the shelf and tail parameters obtained with an HPGe detector. We observed a strong discontinuity in the shelf and tail parameters around the K-edge energy of Ge. This indicates that these parameters are strongly dependent on the mass-attenuation coefficient of the detector material. Therefore, we propose relationships that describe those parameters as a function of the energy and the mass-attenuation coefficient. The implementation of these relationships in a fitting procedure results in a more robust fitting procedure with a much smaller number of fitting parameters. Excellent fits for HPGe spectra can be obtained. Because the detector dependence seems to be fairly general, we could successfully apply the model to Si(Li) spectra also.
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