Publication
Title
Optimal threshold selection for tomogram segmentation by projection distance minimization
Author
Abstract
Language
English
Source (journal)
IEEE transactions on medical imaging / Institute of Electrical and Electronics Engineers [New York, N.Y.] - New York, N.Y.
Publication
New York, N.Y. : 2009
ISSN
0278-0062
Volume/pages
28:5(2009), p. 676-686
ISI
000265748400005
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 24.02.2009
Last edited 16.02.2018
To cite this reference