Publication
Title
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Author
Abstract
Language
English
Source (journal)
Analytical and bioanalytical chemistry. - Berlin, 2002, currens
Publication
Berlin : 2009
ISSN
1618-2642
Volume/pages
393:8(2009), p. 1917-1921
ISI
000264697900013
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.04.2009
Last edited 14.09.2018
To cite this reference