Title
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
article
Publication
Berlin ,
Subject
Chemistry
Source (journal)
Analytical and bioanalytical chemistry. - Berlin, 2002, currens
Volume/pages
393(2009) :8 , p. 1917-1921
ISSN
1618-2642
ISI
000264697900013
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
Recent publications on static secondary ion mass spectrometry (S-SIMS) focus on molecular depth profiling by using polyatomic or ultra-low energy monoatomic projectiles. Since their applicability depends on the relationship between the ion yield and the depth, which is hard to obtain without extensive studies, a combination of a wear test method with S-SIMS surface analysis was performed in the current study. Using this non-sputtering procedure, the relation between the signal intensity and the local concentration remains in principle the same as that at the surface (which is easy to determine). Mechanical erosion was successfully applied to expose sub-surface material from organic multilayers. Through surface analysis with S-SIMS on the gradually exposed deeper planes, molecular depth profiles could be obtained. The study was conducted on a model system relevant to offset printing, consisting of two polymer layers, containing dyes and a surfactant, cast on an Al substrate.
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