Publication
Title
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology
Author
Abstract
Recent publications on static secondary ion mass spectrometry (S-SIMS) focus on molecular depth profiling by using polyatomic or ultra-low energy monoatomic projectiles. Since their applicability depends on the relationship between the ion yield and the depth, which is hard to obtain without extensive studies, a combination of a wear test method with S-SIMS surface analysis was performed in the current study. Using this non-sputtering procedure, the relation between the signal intensity and the local concentration remains in principle the same as that at the surface (which is easy to determine). Mechanical erosion was successfully applied to expose sub-surface material from organic multilayers. Through surface analysis with S-SIMS on the gradually exposed deeper planes, molecular depth profiles could be obtained. The study was conducted on a model system relevant to offset printing, consisting of two polymer layers, containing dyes and a surfactant, cast on an Al substrate.
Language
English
Source (journal)
Analytical and bioanalytical chemistry. - Berlin, 2002, currens
Publication
Berlin : 2009
ISSN
1618-2642
Volume/pages
393:8(2009), p. 1917-1921
ISI
000264697900013
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 01.04.2009
Last edited 01.08.2017
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