Publication
Title
Redeposition and differential sputtering of La in transmission electron microscopy samples of multilayers prepared by focused ion beam
Author
Language
English
Source (journal)
Journal of microscopy. - Oxford
Publication
Oxford : 2008
ISSN
0022-2720
Volume/pages
231:3(2008), p. 359-363
ISI
000259611000001
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 27.05.2009
Last edited 12.08.2017
To cite this reference