Title
Redeposition and differential sputtering of La in transmission electron microscopy samples of <tex>$LaAIO_{3}/SrTiO_{3}$</tex> multilayers prepared by focused ion beamRedeposition and differential sputtering of La in transmission electron microscopy samples of <tex>$LaAIO_{3}/SrTiO_{3}$</tex> multilayers prepared by focused ion beam
Author
Faculty/Department
Faculty of Sciences. Physics
Research group
Electron microscopy for materials research (EMAT)
Publication type
article
Publication
Oxford,
Subject
Physics
Source (journal)
Journal of microscopy. - Oxford
Volume/pages
231(2008):3, p. 359-363
ISSN
0022-2720
ISI
000259611000001
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
E-info
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Handle