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Title
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Redeposition and differential sputtering of La in transmission electron microscopy samples of multilayers prepared by focused ion beam
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Author
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Language
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English
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Source (journal)
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Journal of microscopy. - Oxford
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Publication
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Oxford
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2008
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ISSN
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0022-2720
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DOI
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10.1111/J.1365-2818.2008.02055.X
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Volume/pages
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231
:3
(2008)
, p. 359-363
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ISI
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000259611000001
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Full text (Publisher's DOI)
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