Publication
Title
Refinement of the 200 structure factor for GaAs using parallel and convergent beam electron nanodiffraction data
Author
Abstract
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2009
ISSN
0304-3991
Volume/pages
109:7(2009), p. 802-814
ISI
000266787900005
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 15.07.2009
Last edited 12.10.2018
To cite this reference