Publication
Title
The use of full-field XRF for simultaneous elemental mapping
Author
Abstract
Language
English
Source (book)
X-ray optics and microanalysis: proceedings of the 20th international congress / Denecke, M. [edit.]; et al. [edit.]
Publication
New York, N.Y. : American Institute of Physics, 2010
ISBN
978-0-7354-0764-0
Volume/pages
p. 111-118
ISI
000278534600020
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 12.05.2010
Last edited 05.02.2018
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