Title
|
|
|
|
The use of full-field XRF for simultaneous elemental mapping
| |
Author
|
|
|
|
| |
Abstract
|
|
|
|
The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments. |
| |
Language
|
|
|
|
English
| |
Source (book)
|
|
|
|
X-ray optics and microanalysis: proceedings of the 20th international congress / Denecke, M. [edit.]; et al. [edit.]
| |
Publication
|
|
|
|
New York, N.Y.
:
American Institute of Physics
,
2010
| |
ISBN
|
|
|
|
978-0-7354-0764-0
| |
DOI
|
|
|
|
10.1063/1.3399236
| |
Volume/pages
|
|
|
|
p. 111-118
| |
ISI
|
|
|
|
000278534600020
| |
Full text (Publisher's DOI)
|
|
|
|
| |
|