Publication
Title
The use of full-field XRF for simultaneous elemental mapping
Author
Abstract
The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments.
Language
English
Source (book)
X-ray optics and microanalysis: proceedings of the 20th international congress / Denecke, M. [edit.]; et al. [edit.]
Publication
New York, N.Y. : American Institute of Physics, 2010
ISBN
978-0-7354-0764-0
Volume/pages
p. 111-118
ISI
000278534600020
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 12.05.2010
Last edited 04.08.2017
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