Title
The use of full-field XRF for simultaneous elemental mapping
Author
Faculty/Department
Faculty of Sciences. Chemistry
Publication type
conferenceObject
Publication
New York, N.Y. :American Institute of Physics, [*]
Subject
Chemistry
Source (book)
X-ray optics and microanalysis: proceedings of the 20th international congress / Denecke, M. [edit.]; et al. [edit.]
ISBN - Hoofdstuk
978-0-7354-0764-0
ISI
000278534600020
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
The characteristics of a Full-Field X-ray Fluorescence (FF-XRF) set-up for element-specific imaging, installed at the HASYLAB synchrotron radiation source, were determined. A lateral resolution of 10 μm and limits of detection in the percentage range were found. Further potential developments in CCDs available for FF-XRF are discussed and the use of polycapillary lenses as image transfer optics is illustrated in some explorative experiments.
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