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Title
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A brief history of 50 years of ICXOM
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Author
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Abstract
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| The ICXOM series of meetings began in 1956 and for over 50 years have been conferences devoted to the topic of "X-ray microanalysis", both for those interested in developing instrumentation and methods of analysis and for scientists mainly interested in using X-ray micro-analysers for investigations of an applied nature. This contribution surveys the ICXOM series origins, its development and trends over the years. |
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Language
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English
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Source (book)
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X-ray optics and microanalysis: proceedings 20th International Congress on X-Ray Optics and Microanalysis, September 15-18, 2009, Karlsruhe, Germany / Denecke, M.A. [edit.]; et al. [edit.]
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Publication
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Melville, N.Y.
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AIP
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2010
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ISBN
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978-0-7354-0764-0
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Volume/pages
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p. 1-6
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ISI
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000278534600001
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