Publication
Title
A brief history of 50 years of ICXOM
Author
Abstract
The ICXOM series of meetings began in 1956 and for over 50 years have been conferences devoted to the topic of "X-ray microanalysis", both for those interested in developing instrumentation and methods of analysis and for scientists mainly interested in using X-ray micro-analysers for investigations of an applied nature. This contribution surveys the ICXOM series origins, its development and trends over the years.
Language
English
Source (book)
X-ray optics and microanalysis: proceedings 20th International Congress on X-Ray Optics and Microanalysis, September 15-18, 2009, Karlsruhe, Germany / Denecke, M.A. [edit.]; et al. [edit.]
Publication
Melville, N.Y. : AIP, 2010
ISBN
978-0-7354-0764-0
Volume/pages
p. 1-6
ISI
000278534600001
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 23.07.2010
Last edited 07.11.2017
To cite this reference