Publication
Title
From thickness dependent exit waves to projected potential: Thickness derivative approach
Author
Abstract
In HREM,duetomultiplescattering,theexitwaveoftheobjectisnonlinearthicknessdependentsothat there isnoone-to-onerelationbetweenobjectstructureandtheexitwave.Thisfeaturehampersthe direct retrievalofstructuralinformationfromexitwaves.Inthispaperwediscussthepossibilityto restoretheobjectstructureinadirectwayusingexitwavesofdifferentthicknesses.Itistheoretically shown thattheamplitudeofthethicknessderivativeexitwave 9qc/qz9 may directlyreflecttheproject potentialinasimpleway.Imagesimulationsshowthatitcanbeappliedtorestoretheprojected potential.
Language
English
Source (journal)
Ultramicroscopy. - Amsterdam
Publication
Amsterdam : 2010
ISSN
0304-3991
Volume/pages
110:5(2010), p. 535-542
ISI
000279065700020
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 14.09.2010
Last edited 11.10.2017
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