Title
From thickness dependent exit waves to projected potential: Thickness derivative approach From thickness dependent exit waves to projected potential: Thickness derivative approach
Author
Faculty/Department
Faculty of Sciences. Physics
Publication type
article
Publication
Amsterdam ,
Subject
Physics
Source (journal)
Ultramicroscopy. - Amsterdam
Volume/pages
110(2010) :5 , p. 535-542
ISSN
0304-3991
ISI
000279065700020
Carrier
E
Target language
English (eng)
Full text (Publishers DOI)
Affiliation
University of Antwerp
Abstract
In HREM,duetomultiplescattering,theexitwaveoftheobjectisnonlinearthicknessdependentsothat there isnoone-to-onerelationbetweenobjectstructureandtheexitwave.Thisfeaturehampersthe direct retrievalofstructuralinformationfromexitwaves.Inthispaperwediscussthepossibilityto restoretheobjectstructureinadirectwayusingexitwavesofdifferentthicknesses.Itistheoretically shown thattheamplitudeofthethicknessderivativeexitwave 9qc/qz9 may directlyreflecttheproject potentialinasimpleway.Imagesimulationsshowthatitcanbeappliedtorestoretheprojected potential.
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