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Title
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From thickness dependent exit waves to projected potential: Thickness derivative approach
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Author
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Abstract
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| In HREM,duetomultiplescattering,theexitwaveoftheobjectisnonlinearthicknessdependentsothat there isnoone-to-onerelationbetweenobjectstructureandtheexitwave.Thisfeaturehampersthe direct retrievalofstructuralinformationfromexitwaves.Inthispaperwediscussthepossibilityto restoretheobjectstructureinadirectwayusingexitwavesofdifferentthicknesses.Itistheoretically shown thattheamplitudeofthethicknessderivativeexitwave 9qc/qz9 may directlyreflecttheproject potentialinasimpleway.Imagesimulationsshowthatitcanbeappliedtorestoretheprojected potential. |
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Language
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English
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Source (journal)
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Ultramicroscopy. - Amsterdam
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Publication
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Amsterdam
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2010
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ISSN
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0304-3991
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Volume/pages
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110
:5
(2010)
, p. 535-542
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ISI
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000279065700020
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Full text (Publisher's DOI)
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