Publication
Title
Characterization of nickel silicides using EELS-based methods
Author
Abstract
Language
English
Source (journal)
Journal of microscopy. - Oxford
Publication
Oxford : 2010
ISSN
0022-2720
Volume/pages
240:1(2010), p. 75-82
ISI
000281715400009
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 02.12.2010
Last edited 12.09.2018
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