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Title
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Synchrotron X-ray fluorescence analysis in environmental and earth sciences
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Author
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Abstract
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| Compared to other microscopic analytical tools X-ray microscopy techniques have the advantage that the large penetration depth of X-rays in matter allows one to investigate the interior of an object without destructive sample preparation. In combination with X-ray fluorescence tomography, analytical information from inside of a specimen can be obtained. Different X-ray analytical techniques can be used to produce contrast, X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample. Scanning microscopy on the basis of various lens systems in synchrotron radiation sources provides a routine spatial resolution of now about 100 nanometer but in the foreseeable future a 1020 nanometer spatial resolution can be expected. X-ray absorption spectrometry can also provide chemical (speciation) information on the sample. All this makes X-ray microscopy attractive to many fields of science. In this paper the techniques are briefly reviewed and a number of applications in the earth, planetary and cosmos sciences are illustrated with state-of-the art examples, while applications in the environmental sciences and biology are also briefly discussed. |
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Language
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English
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Source (journal)
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EPJ Web of Conferences
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Publication
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2010
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ISSN
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2100-014X
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Volume/pages
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9
(2010)
, p. 165-180
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ISI
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000290751000013
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Full text (Publisher's DOI)
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Full text (open access)
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