Publication
Title
Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite
Author
Abstract
The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface.
Language
English
Source (journal)
Microscopy research and technique. - New York, N.Y.
Publication
New York, N.Y. : 2011
ISSN
1059-910X
Volume/pages
74:1(2011), p. 84-91
ISI
000285976000012
Full text (Publisher's DOI)
Full text (publisher's version - intranet only)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
Affiliation
Publications with a UAntwerp address
External links
Web of Science
Record
Identification
Creation 16.02.2011
Last edited 04.11.2017
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