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Title
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Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite
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Author
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Abstract
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| The irradiation effects of thinning a sample of a Cu-Zn-Al shape memory alloy to electron transparency by a Ga+ focused ion beam were investigated. This thinning method was compared with conventional electropolishing and Ar+ ion milling. No implanted Ga was detected but surface FCC precipitation was found as a result of the focused ion beam sample preparation. Decreasing the irradiation dose by lowering the energy and current of the Ga+ ions did not lead to a complete disappearance of the FCC structure. The latter could only be removed after gentle Ar+ ion milling of the sample. It was further concluded that the precipitation of the FCC is independent of the crystallographic orientation of the surface. |
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Language
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English
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Source (journal)
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Microscopy research and technique. - New York, N.Y.
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Publication
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New York, N.Y.
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2011
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ISSN
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1059-910X
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DOI
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10.1002/JEMT.20877
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Volume/pages
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74
:1
(2011)
, p. 84-91
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ISI
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000285976000012
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Full text (Publisher's DOI)
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Full text (publisher's version - intranet only)
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