Publication
Title
TEM annular objective apertures fabricated by FIB
Author
Language
English
Source (journal)
Microscopy and microanalysis. - Cambridge, Mass.
Publication
Cambridge, Mass. : 2004
ISSN
1431-9276
Volume/pages
10:S:2(2004), p. 1148-1149
Full text (Publisher's DOI)
UAntwerpen
Faculty/Department
Research group
Publication type
Subject
External links
Record
Identification
Creation 28.03.2011
Last edited 22.12.2015